Variability Improvement by Interface Passivation and EOT Scaling of InGaAs Nanowire MOSFETs
Publication information:
Gu, Jiangjiang, Xinwei Wang, Heng Wu, Roy Gordon, and Peide Ye. “Variability Improvement by Interface Passivation and EOT Scaling of InGaAs Nanowire MOSFETs”. IEEE Electron Device Letters 34, no. 5 (2013): 608-10.